Qing Guo: Correlations between magnetic and piezoelectric response at gated LaAlO3/SrTiO3 interfaces

The interface between perovskite oxide semiconductors LaAlO3 and SrTiO3 exhibits remarkable conducting, superconducting, magnetic, and spintronic properties that are strongly influenced by electron density. Scanning probe methods have the ability to probe local properties of interest. For example, magnetic force microscopy (MFM) has be used to measure magnetism at the LaAlO3/SrTiO3 interface, while piezoelectric force microscopy has been used to measure the local electron density. Here we directly compare these two methods to provide further insight into the relationship between electron density and magnetic properties.